Metre (unit)/Bibliography: Difference between revisions
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*An interesting discussion of interferometric methods and instruments. {{cite book |title=Optical shop testing |editor=Daniel Malacara, ed. |url=http://books.google.com/books?id=RME5F4bpjncC&pg=PA667|pages=pp. 667 ''ff'' |chapter=Chapter 15: Surface profilers, multiple wavelength, and white light interferometry |author=J Schmit, K Creath, and JC Wyant |isbn= 0471484040 |year=2007 |edition=3rd ed |publisher=Wiley-Interscience}} | *An interesting discussion of interferometric methods and instruments. {{cite book |title=Optical shop testing |editor=Daniel Malacara, ed. |url=http://books.google.com/books?id=RME5F4bpjncC&pg=PA667|pages=pp. 667 ''ff'' |chapter=Chapter 15: Surface profilers, multiple wavelength, and white light interferometry |author=J Schmit, K Creath, and JC Wyant |isbn= 0471484040 |year=2007 |edition=3rd ed |publisher=Wiley-Interscience}} | ||
*A thorough discussion of metrology of the metre. {{cite book |title= Handbook of Laser Technology and Applications: Applications |chapter=Chapter D2.1: Fundamental length metrology |author=J Flügge, F Riehle, and H Kunzmann |editor=Colin E. Webb, Julian D. C. Jones, eds |url=http://books.google.com/books?id=8wPekoJyfEUC&pg=PA1723 |pages=pp. 1723 ''ff'' |isbn=0750309660 |year=2004 |publisher=Taylor & Francis}} | *A thorough discussion of metrology of the metre. {{cite book |title= Handbook of Laser Technology and Applications: Applications |chapter=Chapter D2.1: Fundamental length metrology |author=J Flügge, F Riehle, and H Kunzmann |editor=Colin E. Webb, Julian D. C. Jones, eds |url=http://books.google.com/books?id=8wPekoJyfEUC&pg=PA1723 |pages=pp. 1723 ''ff'' |isbn=0750309660 |year=2004 |publisher=Taylor & Francis}} | ||
*Discussion of metrological traceability for the interferometer and the atomic force microscope, among other techniques. {{cite book |title=Fundamental Principles of Engineering Nanometrology (Micro and Nano Technologies) |editor=Richard Leach, ed |url=http://www.amazon.com/Fundamental-Principles-Engineering-Nanometrology-Technologies/dp/0080964540/ref=sr_1_1?s=books&ie=UTF8&qid=1302465273&sr=1-1#reader_0080964540 |isbn=0080964540 |year=2009 |publisher=Elsevier /William Andrew}} | |||
Latest revision as of 15:03, 10 April 2011
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- Description of how the known silicon lattice spacing can be used to set up the wavelength of Mössbauer radiation as a convenient length standard at atomic scales. Yu V Shvyd'ko et al. (2000). "γ-ray wavelength as standard for atomic scales". Phys Rev Lett vol 85: pp. 495-498. DOI:10.1103/PhysRevLett.85.495. Research Blogging.
- An interesting discussion of interferometric methods and instruments. J Schmit, K Creath, and JC Wyant (2007). “Chapter 15: Surface profilers, multiple wavelength, and white light interferometry”, Daniel Malacara, ed.: Optical shop testing, 3rd ed. Wiley-Interscience, pp. 667 ff. ISBN 0471484040.
- A thorough discussion of metrology of the metre. J Flügge, F Riehle, and H Kunzmann (2004). “Chapter D2.1: Fundamental length metrology”, Colin E. Webb, Julian D. C. Jones, eds: Handbook of Laser Technology and Applications: Applications. Taylor & Francis, pp. 1723 ff. ISBN 0750309660.
- Discussion of metrological traceability for the interferometer and the atomic force microscope, among other techniques. (2009) Richard Leach, ed: Fundamental Principles of Engineering Nanometrology (Micro and Nano Technologies). Elsevier /William Andrew. ISBN 0080964540.